AI-Based Testing Frameworks for Next-Generation Semiconductor Devices. MSW Management Journal, [S. l.], v. 34, n. 2, p. 1272–1294, 2025. DOI: 10.7492/03r44y24. Disponível em: https://mswmanagementj.com/index.php/home/article/view/379.. Acesso em: 25 jul. 2025.